Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California

Author(s)

• Prasad, Sharad
• Hartmann, Hans-Dieter
• Tsujide, Tohru
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California

Sharad Prasad, Hans-Dieter Hartmann, Tohru Tsujide, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Solid State Technology ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3510）

SPIE, c1998

Other Title

Microelectronic manufacturing yield, reliability, and failure analysis 4

Note

Includes bibliographical references and author index

Description and Table of Contents

Description

A collection of papers on microelectronic manufacturing yield, reliability, and failure. It discusses advanced failure analysis, simulation, and packaging-related reliability issues, among other topics.

by "Nielsen BookData"

Details

• NCID: BC07259982
• ISBN:
  • 0819429694
• LCCN: 99194427
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Washington
• Pages/Volumes: vii, 240 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC21 : 621.381
• Subject Headings:
  • LCSH : Microelectronics Congresses
  • LCSH : Integrated circuits -- Very large scale integration Congresses
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Defects Congresses
  • LCSH : Integrated circuits -- Testing Congresses
• Parent Bibliography ID:
  • BA0022700X