Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore

著者

• Tan, Cher Ming
• Society of Photo-optical Instrumentation Engineers
• Nanyang Technological University
• Institute of Physics, Singapore

書誌事項

Microelectronic yield, reliability, and advanced packaging : 28-30 November 2000, Singapore

Cher Ming Tan ... [et al.], chairs/editors ; sponsored by Nanyang Technological University (Singapore) [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, Institute of Physics (Singapore) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4229）

SPIE, c2000

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BC0747336X
• ISBN:
  • 0819439010
• LCCN: 2001277635
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: xvii, 222 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7875
  • DC21 : 621.381
• 件名:
  • LCSH : Microelectromechanical systems -- Reliability -- Congresses
  • LCSH : Microelectronic packaging -- Congresses
• 親書誌ID:
  • BA0022700X