Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA

Author(s)

• Chin, Aland K.
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA

Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4285）

SPIE, c2001

Note

Includes bibliographic references and author index

Details

• NCID: BC07476197
• ISBN:
  • 0819439630
• LCCN: 2001277958
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Washington
• Pages/Volumes: xxxii, 246 p.
• Size: 28 cm
• Classification:
  • LCC : TK8300
  • DC21 : 621.3815/2
• Subject Headings:
  • LCSH : Optoelectronic devices -- Testing -- Congresses
  • LCSH : Optoelectronic devices -- Reliability -- Congresses
• Parent Bibliography ID:
  • BA0022700X