Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA
Author(s)
Bibliographic Information
Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA
（Proceedings of Electronic Imaging Science and Technology）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5303）
SPIE, c2004
- pbk.
- Other Title
-
Proceedings of electronic imaging science and technology
Electronic imaging science and technology
Machine vision applications in industrial inspection 12
Available at / 1 libraries
-
No Libraries matched.
- Remove all filters.
Note
Includes bibliographical references and index
Description and Table of Contents
Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
by "Nielsen BookData"
