Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA

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書誌事項

Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA

Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

（Proceedings of Electronic Imaging Science and Technology）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6070）

SPIE , IS&T, c2006

  • pbk.

タイトル別名

Electronic imaging science and technology

Machine vision applications in industrial inspection 14

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注記

Includes bibliographical references and author index

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