Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA

著者

• Mériaudeau, Fabrice
• Niel, Kurt S.
• IS&T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

書誌事項

Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA

Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

（Proceedings of Electronic Imaging Science and Technology）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6070）

SPIE , IS&T, c2006

• pbk.

タイトル別名

Electronic imaging science and technology

Machine vision applications in industrial inspection 14

注記

Includes bibliographical references and author index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

「Nielsen BookData」 より

• NII書誌ID(NCID): BC07703390
• ISBN:
  • 0819461105
• LCCN: 2006286985
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.,Springfield, Va.
• ページ数/冊数: 1 v. (various pagings)
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
  • DC22 : 670.42/5
• 件名:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Measurement -- Congresses
• 親書誌ID:
  • BA86017226
  • BA0022700X
• リンク:
  • www.loc.gov/catdir/toc/fy0710/2006286985.html