Nonlinear image processing and pattern analysis XII : 22-23 January 2001, San Jose, [California] USA

Author(s)

• Dougherty, Edward R.
• Astola, Jaakko
• IS&T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Nonlinear image processing and pattern analysis XII : 22-23 January 2001, San Jose, [California] USA

Edward R. Dougherty, Jaakko T. Astola, chairs/editors ; sponsored by IS&T--The Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4304）

SPIE, c2001

Other Title

Nonlinear image processing and pattern analysis 12

Note

Includes bibliographical references and author index

Details

• NCID: BC07705534
• ISBN:
  • 0819439827
• LCCN: 2002265472
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Washington
• Pages/Volumes: vii, 328 p.
• Size: 28 cm
• Classification:
  • LCC : TA1632
  • DC21 : 621.36/7
• Subject Headings:
  • LCSH : Image processing -- Digital techniques -- Congresses
  • LCSH : Digital filters (Mathematics) -- Congresses
• Parent Bibliography ID:
  • BA0022700X