書誌事項

Nonlinear image processing and pattern analysis XII : 22-23 January 2001, San Jose, [California] USA

Edward R. Dougherty, Jaakko T. Astola, chairs/editors ; sponsored by IS&T--The Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 4304)

SPIE, c2001

タイトル別名

Nonlinear image processing and pattern analysis 12

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注記

Includes bibliographical references and author index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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