Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA

著者

• Geer, Robert E.
• Society of Photo-optical Instrumentation Engineers
• American Society of Mechanical Engineers
• Intelligent Materials Forum (Mitō Kagaku Gijutsu Kyōkai)
• Jet Propulsion Laboratory (U.S.)
• National Science Foundation (U.S.)

書誌事項

Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA

Robert E. Geer ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), National Science Foundation (USA)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6175）

SPIE, c2006

• pbk.

タイトル別名

Testing, reliability, and application of micro- and nano-material systems 4

注記

Includes bibliographical references and author index

• NII書誌ID(NCID): BC07808231
• ISBN:
  • 0819462284
• LCCN: 2006282472
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: 1 v. (various pagings)
• 大きさ: 28 cm
• 分類:
  • LCC : TA1750
• 件名:
  • LCSH : Electrooptical devices -- Materials -- Testing -- Congresses
  • LCSH : Photonics -- Materials -- Testing -- Congresses
  • LCSH : Nanostructured materials -- Testing -- Congresses
  • LCSH : Microelectromechanical systems -- Testing -- Congresses
• 親書誌ID:
  • BA0022700X