CiNii Books - Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA

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Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA

Robert E. Geer ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), National Science Foundation (USA)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6175）

SPIE, c2006

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Other Title: Testing, reliability, and application of micro- and nano-material systems 4

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東京科学大学大岡山図書館

pbk.P63600/6175130994881

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Includes bibliographical references and author index

Description and Table of Contents

Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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