Lightmetry 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland

著者

• Pluta, Maksymilian
• Szyjer, Mariusz
• Powichrowska, Ewa
• Society of Photo-optical Instrumentation Engineers. Poland Chapter
• Institute of Applied Optics (Poland)
• Society of Photo-optical Instrumentation Engineers
• Komitet Badań Naukowych (Poland)

書誌事項

Lightmetry 2002 : metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland

Maksymilian Pluta, Mariusz Szyjer, chairs/editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering

（SPIE Poland Chapter proceedings, 68）（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5064）

SPIE, c2003

タイトル別名

Metrology and testing techniques using light

注記

Previous conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BC0785076X
• ISBN:
  • 0819448702
• LCCN: 2004296369
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: xx, 338 p.
• 大きさ: 28 cm
• 分類:
  • LCC : QC367
• 件名:
  • LCSH : Light -- Congresses
  • LCSH : Polarization (Light) -- Congresses
  • LCSH : Optical measurements -- Congresses
  • LCSH : Optical detectors -- Congresses
  • LCSH : Measurement -- Congresses
• 親書誌ID:
  • BA26782753
  • BA0022700X