Advances in imaging and electron physics
著者
書誌事項
Advances in imaging and electron physics
Academic Press, an imprint of Elsevier, c2021
- v. 219
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
目次
Preface Martin Hytch and Peter W. Hawkes 1. Introduction to strain characterization method in transmission electron microscopy Alexandre Pofelski? 2. Moire sampling in scanning transmission electron microscopy Alexandre Pofelski? 3. Scanning transmission electron microscopy moire sampling geometrical phase analysis (STEM moire GPA) Alexandre Pofelski? 4. Performance of scanning transmission electron microscopy moire sampling geometrical phase analysis Alexandre Pofelski? 5. Applications of scanning transmission electron microscopy moire sampling geometrical phase analysis Alexandre Pofelski? 6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail 7. Superconducting electron lenses David Hardy 8. Lorentz microscopy or electron phase microscopy of magnetic objects Richard Harry Wade
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