Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany

著者

• Osten, Wolfgang
• Creath, Katherine
• Kujawińska, Małgorzata
• Society of Photo-optical Instrumentation Engineers
• European Optical Society
• Wissenschaftliche Gesellschaft Lasertechnik

書誌事項

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany

Wolfgang Osten, Katherine Creath, Malgorzata Kujawinska, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5144）

SPIE, c2003

タイトル別名

Optical measurement systems for industrial inspection 3

注記

Includes bibliographical references and index

内容説明・目次

内容説明

At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering.

「Nielsen BookData」 より

• NII書誌ID(NCID): BC08177169
• ISBN:
  • 0819450146
• LCCN: 2004297769
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: xviii, 896 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TS156.2
• 件名:
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Optical instruments -- Industrial applications -- Congresses
  • LCSH : Optical detectors -- Industrial applications -- Congresses
• 親書誌ID:
  • BA0022700X