Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany

Author(s)

• Osten, Wolfgang
• Creath, Katherine
• Kujawińska, Małgorzata
• Society of Photo-optical Instrumentation Engineers
• European Optical Society
• Wissenschaftliche Gesellschaft Lasertechnik

Bibliographic Information

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany

Wolfgang Osten, Katherine Creath, Malgorzata Kujawinska, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5144）

SPIE, c2003

Other Title

Optical measurement systems for industrial inspection 3

Note

Includes bibliographical references and index

Description and Table of Contents

Description

At head of title: proceedings of SPIE, SPIE--the Society for Optical Engineering.

by "Nielsen BookData"

Details

• NCID: BC08177169
• ISBN:
  • 0819450146
• LCCN: 2004297769
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: xviii, 896 p.
• Size: 28 cm
• Classification:
  • LCC : TS156.2
• Subject Headings:
  • LCSH : Quality control -- Optical methods -- Congresses
  • LCSH : Optical instruments -- Industrial applications -- Congresses
  • LCSH : Optical detectors -- Industrial applications -- Congresses
• Parent Bibliography ID:
  • BA0022700X