Optical fabrication, testing, and metrology III : 2-4 September 2008, Glasgow, United Kingdom

Author(s)

• Duparré, Angela
• Geyl, Roland
• SPIE Europe
• Scottish Optoelectronics Association
• Europäische Forschungsgesellschaft Dünne Schichten

Bibliographic Information

Optical fabrication, testing, and metrology III : 2-4 September 2008, Glasgow, United Kingdom

Angela Duparré, Roland Geyl, editors ; sponsored by SPIE Europe ; cosponsored by Scottish Optoelectronic Association (United Kingdom) ; cooperating organisations, EFDS--Europäische Forschungsgesellschaft Dünne Schichten e.V. (Germany) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 7102）

SPIE, [2008]

Other Title

Optical fabrication, testing, and metrology 3

Note

Includes bibliographical references and author index

Details

• NCID: BC08180210
• ISBN:
  • 9780819473325
• LCCN: 2010287148
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Washington
• Pages/Volumes: 1 v. (various pagings)
• Size: 28 cm
• Classification:
  • LCC : TS510
• Subject Headings:
  • LCSH : Optical instruments -- Design and construction -- Congresses
  • LCSH : Optical instruments -- Testing -- Congresses
  • LCSH : Optical materials -- Congresses
  • LCSH : Metrology -- Congresses
• Parent Bibliography ID:
  • BA0022700X