Image matching and analysis : 22-24 October 2001, Wuhan, China

Author(s)

• SPIE International Symposium on Multispectral Image Processing and Pattern Recognition
• Bhanu, Bir
• Shen, Jun
• Zhang, Tianxu
• Society of Photo-optical Instrumentation Engineers
• Hua chung kung hsüeh yüan
• Université de Bordeaux III
• National Natural Science Foundation of China
• 中华人民共和国教育部 チュウカ ジンミン キョウワコク キョウイクブ zhong hua ren min gong he guo jiao yu bu

Bibliographic Information

Image matching and analysis : 22-24 October 2001, Wuhan, China

Bir Bhanu, Jun Shen, Tianxu Zhang, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] Huazhong University of Science and Technology (China) ; cosponsored by Université de Bordeaux III (France) ... [et al.] ; supported by National Natural Science Foundation of China [and] Ministry of Education of China

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4552）

SPIE, c2001

• pbk.

Note

"Second SPIE International Symposium on Multispectral Image Processing and Pattern Recognition"--P. xi

Addendum tipped in

Includes bibliographical references and index

Details

• NCID: BC08223608
• ISBN:
  • 0819442801
• LCCN: 2002277664
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash., USA
• Pages/Volumes: xi, 342 p.
• Size: 28 cm
• Classification:
  • LCC : TA1630
  • DC21 : 621.36/7
• Subject Headings:
  • LCSH : Image registration -- Congresses
  • LCSH : Pattern recognition systems -- Congresses
  • LCSH : Image analysis -- Congresses
  • LCSH : Matching theory -- Congresses
• Parent Bibliography ID:
  • BA0022700X