Independent component analyses, wavelets, unsupervised smart sensors, and neural networks II : 14-15 April 2004, Orlando, Florida, USA
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Independent component analyses, wavelets, unsupervised smart sensors, and neural networks II : 14-15 April 2004, Orlando, Florida, USA
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 5439)
SPIE, c2004
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Independent component analyses, wavelets, and neural networks
Independent component analyses, wavelets, unsupervised smart sensors, and neural networks 2
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注記
Earlier conference entitled: Independent component analyses, wavelets, and neural networks
Includes bibliographical references and index
