Independent component analyses, wavelets, unsupervised smart sensors, and neural networks III : 30 March-1 April, 2005, Orlando, Florida, USA
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Independent component analyses, wavelets, unsupervised smart sensors, and neural networks III : 30 March-1 April, 2005, Orlando, Florida, USA
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 5818)
SPIE, c2005
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Independent component analyses, wavelets, and neural networks
Independent component analyses, wavelets, unsupervised smart sensors, and neural networks 3
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注記
First conference entitled: Independent component analyses, wavelets, and neural networks
Includes bibliographical references and author index