Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks VI : 17-19 March 2008, Orlando, Florida, USA
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Bibliographic Information
Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks VI : 17-19 March 2008, Orlando, Florida, USA
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 6979)
SPIE, c2008
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Independent component analyses, wavelets, and neural networks
Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks
Independent component analyses, wavelets, unsupervised nano-biomimetic sensors, and neural networks 6
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Includes bibliographical references and author index
Description and Table of Contents
Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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