Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA

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Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA

Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA) ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5115）

SPIE, c2003

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Includes bibliographic references and author index

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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