Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA

著者

• Kish, Laszlo B.
• Society of Photo-optical Instrumentation Engineers
• Texas A & M University. Department of Electrical Engineering. Telecommunications Task Force

書誌事項

Noise and information in nanoelectronics, sensors, and standards : 2-4 June 2003, Santa Fe, New Mexico, USA

Laszlo B. Kish ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] TAMU Telecommunications Task Force (USA) ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5115）

SPIE, c2003

注記

Includes bibliographic references and author index

• NII書誌ID(NCID): BC08271906
• ISBN:
  • 081944975X
• LCCN: 2004268428
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Washington
• ページ数/冊数: xix, 430 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7867.5
  • DC22 : 621.382/24
• 件名:
  • LCSH : Electronic noise -- Congresses
  • LCSH : Electronic noise -- Standards -- Congresses
  • LCSH : Quantum electronics -- Congresses
  • LCSH : Nanotechnology -- Congresses
  • LCSH : Information technology. -- Congresses
  • LCSH : Detectors. -- Congresses
• 親書誌ID:
  • BA0022700X