Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA

著者

• Deen, M. Jamal
• Çelik-Butler, Zeynep
• Levinshtein, Michael E.
• Society of Photo-optical Instrumentation Engineers
• National Semiconductor Corporation

書誌事項

Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA

M. Jamal Deen, Zeynep Çelik-Butler, Michael E. Levinshtein, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, National Semiconductor Corporation ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5113）

SPIE, c2003

注記

Includes bibliographical references and author index

• NII書誌ID(NCID): BC08272501
• ISBN:
  • 0819449733
• LCCN: 2003284227
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: xxi, 516 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7867.5
  • DC22 : 621.382/24
• 件名:
  • LCSH : Electronic circuits -- Noise -- Congresses
  • LCSH : Electronic noise -- Congresses
  • LCSH : Electric circuits -- Noise -- Congresses
  • LCSH : Electric noise -- Congresses
• 親書誌ID:
  • BA0022700X