Practical electron microscopy of lattice defects

書誌事項

Practical electron microscopy of lattice defects

Hiroyasu Saka

World Scientific, c2021

大学図書館所蔵 件 / 4

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注記

Includes bibliographical references (p. 285-286) and index

内容説明・目次

内容説明

'Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.' [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

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詳細情報

  • NII書誌ID(NCID)
    BC08571604
  • ISBN
    • 9789811234699
  • LCCN
    2021936018
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Hackensack, N.J.
  • ページ数/冊数
    xiii, 294 p.
  • 大きさ
    24 cm
  • 件名
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