Practical electron microscopy of lattice defects

Author(s)

Bibliographic Information

Practical electron microscopy of lattice defects

Hiroyasu Saka

World Scientific, c2021

Available at  / 4 libraries

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Note

Includes bibliographical references (p. 285-286) and index

Details

  • NCID
    BC08571604
  • ISBN
    • 9789811234699
  • LCCN
    2021936018
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Hackensack, N.J.
  • Pages/Volumes
    xiii, 294 p.
  • Size
    24 cm
  • Subject Headings
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