{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BC11922616.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BC11922616#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BC11922616.json"},"dc:title":[{"@value":"Engineering circuit analysis"}],"dc:creator":"J. David Irwin, R. Mark Nelms","dc:publisher":[{"@value":"Wiley"}],"dcterms:extent":"xv, 789, 8, 12 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"2022","cinii:ncid":"BC11922616","prism:edition":"12th ed., International adaptation","cinii:ownerCount":"5","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03144051#entity","@type":"foaf:Person","foaf:name":[{"@value":"Irwin, J. David"}]},{"@type":"foaf:Person","foaf:name":[{"@value":"Nelms, R. Mark"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA006678","@type":"foaf:Organization","foaf:name":"明治大学 図書館","rdfs:seeAlso":{"@id":"https://opac2018.lib.meiji.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BC11922616"}},{"@id":"https://ci.nii.ac.jp/library/FA007444","@type":"foaf:Organization","foaf:name":"日本福祉大学 付属図書館","rdfs:seeAlso":{"@id":"http://library.n-fukushi.ac.jp/mylimedio/search/search.do?target=local&mode=comp&category-mgz=1&category-book=1&annex=all&ncid=BC11922616"}},{"@id":"https://ci.nii.ac.jp/library/FA007739","@type":"foaf:Organization","foaf:name":"立命館大学 図書館","rdfs:seeAlso":{"@id":"http://runners.ritsumei.ac.jp/opac/opac_openurl/?ncid=BC11922616"}},{"@id":"https://ci.nii.ac.jp/library/FA007954","@type":"foaf:Organization","foaf:name":"追手門学院大学 附属図書館","rdfs:seeAlso":{"@id":"https://lib-opac.otemon.ac.jp/opac/opac_openurl/?ncid=BC11922616"}},{"@id":"https://ci.nii.ac.jp/library/FA013039","@type":"foaf:Organization","foaf:name":"静岡理工科大学 附属図書館","rdfs:seeAlso":{"@id":"https://sistlb.sist.ac.jp/mylimedio/search/search.do?target=local&mode=comp&category-mgz=1&category-book=1&annex=all&ncid=BC11922616"}}],"prism:publicationDate":["c2022"],"cinii:note":["Previous ed.: 2015","\"The content provided in this textbook is based on Basic Engineering Circuit analysis ... 12th edition [2021]. John Wiley & Sons Singapore Pre. Ltd\"--T.p. verso","Includes index"],"dc:subject":["DC23:621.3192"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electric+circuit+analysis+--+Problems%2C+exercises%2C+etc.","dc:title":"Electric circuit analysis -- Problems, exercises, etc."},{"@id":"https://ci.nii.ac.jp/books/search?q=Electric+circuit+analysis","dc:title":"Electric circuit analysis"},{"@id":"https://ci.nii.ac.jp/books/search?q=Electric+circuit+analysis+--+Problems%2C+exercises%2C+etc","dc:title":"Electric circuit analysis -- Problems, exercises, etc"}],"dcterms:hasPart":[{"@id":"urn:isbn:9781119667964"}]}]}