Overcoming the measurement challenges of advanced semiconductor technologies : DC, pulse, and RF - from modeling to manufacturing

著者

書誌事項

Overcoming the measurement challenges of advanced semiconductor technologies : DC, pulse, and RF - from modeling to manufacturing

Keithley, c2005

• NII書誌ID(NCID): BC12708178
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Cleveland]
• ページ数/冊数: iii, 140 p.
• 大きさ: 22 cm