X-ray diffraction imaging : technology and applications

Author(s)

• Greenberg, Joel (Joel Alter)
• Iniewski, Krzysztof

Bibliographic Information

X-ray diffraction imaging : technology and applications

edited by Joel Greenberg ; managing editor, Krzysztof Iniewski

（Devices, circuits, and systems）

CRC Press, Taylor & Francis, c2019

• : hardback

Note

Includes bibliographical references and index

Details

• NCID: BC13374351
• ISBN:
  • 9781498783613
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Boca Raton, Fla.
• Pages/Volumes: xxi, 255 p.
• Size: 24 cm
• Classification:
  • LCC : TA417.25
  • DC23 : 620.1/1272
• Subject Headings:
  • LCSH : X-ray diffraction imaging
  • LCSH : Radiography, Industrial
  • LCSH : Detectors -- Equipment and supplies
  • LCSH : Refractometers
• Parent Bibliography ID:
  • BB03870779