X-ray diffraction imaging : technology and applications

著者

• Greenberg, Joel (Joel Alter)
• Iniewski, Krzysztof

書誌事項

X-ray diffraction imaging : technology and applications

edited by Joel Greenberg ; managing editor, Krzysztof Iniewski

（Devices, circuits, and systems）

CRC Press, Taylor & Francis, c2019

• : hardback

注記

Includes bibliographical references and index

• NII書誌ID(NCID): BC13374351
• ISBN:
  • 9781498783613
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boca Raton, Fla.
• ページ数/冊数: xxi, 255 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA417.25
  • DC23 : 620.1/1272
• 件名:
  • LCSH : X-ray diffraction imaging
  • LCSH : Radiography, Industrial
  • LCSH : Detectors -- Equipment and supplies
  • LCSH : Refractometers
• 親書誌ID:
  • BB03870779