Atomic force microscopy

Author(s)

    • Voigtländer, Bert

Bibliographic Information

Atomic force microscopy

Bert Voigtländer

(Nanoscience and technology)

Springer, c2019

2nd ed

Available at  / 1 libraries

Search this Book/Journal

Note

"The first edition (2015, ISBN 978-3-662-45240-0) was published under the title, "Scanning Probe Microscopy"."--T.p. verso

Includes bibliographical references and index

Related Books: 1-1 of 1

Details

  • NCID
    BC13469786
  • ISBN
    • 9783030136567
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Cham
  • Pages/Volumes
    xiv, 331 p.
  • Size
    24 cm
  • Parent Bibliography ID
Page Top