Experimental mechanics : an introduction

Author(s)
    • Gdoutos, Emmanuel E.
Bibliographic Information

Experimental mechanics : an introduction

Emmanuel E. Gdoutos

(Solid mechanics and its applications, v. 269)

Springer, c2022

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Note

Includes bibliographical references and index

Description and Table of Contents

Description

The book presents in a clear, simple, straightforward, novel and unified manner the most used methods of experimental mechanics of solids for the determination of displacements, strains and stresses. Emphasis is given on the principles of operation of the various methods, not in their applications to engineering problems. The book is divided into sixteen chapters which include strain gages, basic optics, geometric and interferometric moire, optical methods (photoelasticity, interferometry, holography, caustics, speckle methods, digital image correlation), thermoelastic stress analysis, indentation, optical fibers, nondestructive testing, and residual stresses. The book will be used not only as a learning tool, but as a basis on which the researcher, the engineer, the experimentalist, the student can develop their new own ideas to promote research in experimental mechanics of solids.

Table of Contents

Contents 1. Electrical Resistance Strain Gages 1.1 Introduction 1.2 Basic Principle 1.3 Bonded Resistance Strain Gages 1.4 Transverse Sensitivity and Gage Factor 1.5 Electrical Circuits 1.5.1 Introduction 1.5.2 The potentiometer Circuit 1.5.3The Wheatstone Bridge 1.6 Strain Gage Rosettes 2. Fundamentals of optics 2.1 Introduction 2.2 Historical Overview 2.3 Light Sources, Wave Fronts, and Rays 2.4 Reflection and Mirrors 2.4.1 Reflection 2.4.2 Plane Mirrors 2.4.3 Spherical Mirrors 2.5 Refraction 2.6 Thin Lenses 2.7 The Wave Nature of light - Huygens' Principle 2.8 Electromagnetic Theory of Light 2.9 Polarization 2.10 Interference 2.10.1 Introduction 2.10.2 Interference of Two Linearly Polarized Beams 2.10.3 Young's Double-Slit Experiment 2.10.4 Multi-slit interference 2.10.5 Interference of Two Plane Waves 2.10.6 Change of Phase Upon Reflection - Thin films 2.10.7 Dispersion 2.11 Diffraction 2.11.1 Introduction 2.11.2 Single Slit Diffraction 2.11.3 Two Slit Diffraction 2.11.4 The diffraction grating 2.11.5 Diffraction by a Circular Aperture 2.11.6 Limit of Resolution 2.11.7 Fraunhofer Diffraction as a Fourier Transform 2.11.8 Optical Spatial Filtering 2.11.9 The Pinhole Spatial Filter 3. Geometric Moire 3.1 Introduction 3.2 Terminology 3.3 The Moire Phenomenon 3.4 Mathematical Analysis of Moire Fringes 3.5. Relationships Between Line Grating and Moire Fringes 3.6 Moire Patterns Formed by Circular, Radial and Line Gratings 3.7 Measurement of In-Plane Displacements 3.8 Measurement of Out-of-Plane Displacements 3.9 Measurement of Out-of-Plane Slopes 3.10 Sharpening of Moire Fringes 3.11 Moire of Moire 4. Coherent Moire and Moire Interferometry 4.1 Introduction 4.2 Superposition of Two Diffraction Gratings 4.3 Moire Patterns 4.4 Optical Filtering and Fringe Multiplication. 4.5 Advantages Offered by Coherent Moire 4.6 Moire Interferometry 4.6.1 Introduction 4.6.2 Optical Arrangement 4.6.3 The method 4.6.4 Determination of strains 5. Moire patterns formed by remote gratings 5.1 Introduction 5.2 Geometric Moire Methods 5.2.1 Introduction 5.3 The coherent Grading Sensing (CGS) Method 5.3.1 Introduction 5.3.2 Experimental Arrangement 5.3.3 Governing Equations 6. The method of caustics 6.1 Introduction 6.2 Governing Equations for Reflective Surfaces 6.3 The Ellipsoid Mirror 6.4 Intensity of a Light ray Illuminating a Transparent Specimen 6.5 Stress-Optical Equations 6.6 Crack Problems 6.6.1 Introduction 6.6.2 Principle of the Method 6.6.3 Opening-Mode Loading 6.6.4 Mixed-Mode Loading 6.6.5 Anisotropic Materials 6.6.6 The state of Stress Near the Crack Tip 6.6.7 Comparison of the Method of Caustics with Other Optical Methods 7. Photoelasticity 7.1 Introduction 7.2 Plane Polariscope 7.3 Circular Polariscope 7.4 Isoclinics 7.5 Isochromatics 7.6 Isochromatics with White Light 7.7 Properties of Isoclinics 7.8 Properties of Isochromatics 7.9 Compensation 7.9.1 Introduction 7.9.2 The Tension/Compression Specimen 7.9.3 Babinet and Babinet-Soleil Compensators 7.9.4 Sernarmont Compensation Method 7.9.5 Tardy Compensation Method 7.10 Determination of Photoelastic constant fs 7.11 Stress Separation 7.12 Fringe Multiplication and Sharpening 7.13 Transition from Model to Prototype 7.14 Three-Dimensional Photoelasticity 7.15 Photoelastic Coatings 7.15.1 Introduction 7.15.2 Transfer of Stresses From Body to Coating. 7.15.3 Determination of Stresses 7.15.4 Reinforcing Effect 7.15.5 Photoelastic Strain Gages 8. Interferometry 8.1 Introduction 8.2 Interferometric Systems 8.3 Analysis of Interferometric Systems 8.3.1 Introduction 8.3.2 The Mach-Zehnder Interferometer 8.3.3 The Michelson Interferometer 8.3.4 The Fizeau-Type Interferometer 8.3.5 Other Interferometers 8.3.6 A Generic Analysis of Interferometers 9. Holography 9.1 Introduction 9.2 Holography 9.3 Holographic Interferometry 9.3.1 Introduction 9.3.2 Real-Time Holographic Interferometry 9.3.3 Double-Exposure Holographic Interferometry 9.3.4 Sensitivity Vector 9.4 Holographic Photoelasticity 9.4.1 Introduction 9.4.2 Isochromatic-Isopachic Patterns 10. Optical Fiber Strain Sensors 10.1 Introduction 10.2 Optical Fibers 10.2.1 Introduction 10.2.2 Structure 10.2.3 Principle of operation 10.2.4 Applications 10.2.5 Advantages and disadvantages 10.3 Fiber Optic Sensors (FOS) 10.3.1 Architecture of a FOS 10.3.2 Classification of FOSs 10.3.3 Interferometric Fiber Optic Sensors (FOS) 10.3.4 Fiber Bragg Grating Sensors (FBGS) 10.3.5 Multiplexing 10.3.6 Advantages and disadvantages of OFSs 10.3.7 Applications of Fiber Optic Sensors 11. Speckle Methods 11.1 Introduction 11.2 The Speckle Effect 11.3 Speckle Photography 11.3.1 Introduction 11.3.2 Point-by-Point Interrogation of the Specklegram 11.3.3 Spatial Filtering of the Specklegram 11.4 Speckle Interferometry 11.5 Shearography 11.6 Electronic Speckle Pattern Interferometry (ESPI) 12. Digital Image Correlation (DIC) 12.1 Introduction 12.2 Essential Steps of DIC 12.3 Speckle Patterning 12.4 Image Digitization 12.5 Intensity Interpolation 12.6 Image Correlation - Displacement Measurement 12.7 2-D and 3-D Displacement Measurements 13. Thermoelastic Stress Analysis (TSA) 13.1 Introduction 13.2 Thermoelastic Law 11.3 Infrared Detectors 13.4 Adiabaticity 13.5 Specimen Preparation 13.6 Calibration 13.7 Stress Separation 13.8 Applications 14. Indentation 14.1 Introduction 14.2 Contact Mechanics 14.3 Macro-Indentation Testing 14.3.1 Brinell Test 14.3.2 Meyer Test 14.3.3 Vickers Test 14.3.4 Rockwell Test 14.4 Micro-Indentation testing 14.4.1 Vickers Test 14.4.2 Knoop Test 14.5 Nanoindentation Testing 14.5.1 Introduction 14.5.2 The Elastic Contact Method 14.5.3 Nanoindentation for Measuring Fracture Toughness 15. Nondestructive Testing (NDT) 15.1 Introduction 15.2 Dye Penetrant (DPI) 15.2.1 Principle 15.2.2 Application 15.2.3 Advantages and Disadvantages 15.3 Magnetic Particles Inspection (MPI) 15.3.1 Principle 15.3.2 Advantages and Disadvantages 15.4 Eddy Currents Inspection (ECI) 15.4.1 Principle 15.4.2 Advantages and Disadvantages 15.5 X-ray Diffraction 15.5.1 Introduction 15.5.2 X-rays 15.5.3 X-ray Diffraction 15.5.4 Measurement of Strain 15.5.5 Instrumentation 15.6 Ultrasonic Testing (UT) 15.6.1 Introduction 15.6.2 Operation 15.6.3 Advantages and Disadvantages 15.7 Acoustic Emission Testing (AET) 15.7.1 Introduction 15.7.2 Acoustic Emission Testing 15.7.3 Advantages and Disadvantages 16. Residual Stresses - The Hole Drilling Method 16.1 Introduction 16.2 Hole-Drilling Method 16.3 Uniaxial Residual Stresses 16.4 Biaxial Residual Stresses 16.5 Variation of Residual Stresses Through the Thickness 16.6 Nondestructive Methods for Measuring Residual Stresses

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Details
  • NCID
    BC14912812
  • ISBN
    • 9783030894658
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Cham
  • Pages/Volumes
    xxi, 311 p.
  • Size
    25 cm
  • Parent Bibliography ID
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