書誌事項

Test and measurement

Jon Wilson ... [et al.]

(The Newnes know it all series)

Newnes an imprint of Elsevier, c2009

  • : pbk

タイトル別名

Test and measurement : know it all

大学図書館所蔵 件 / 1

この図書・雑誌をさがす

注記

Includes bibliographical references and index

内容説明・目次

内容説明

The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing.

目次

Chapter 1 Fundamental of measurementChapter 2 Sensors and TransducersChapter 3. Data acquisition hardware and softwareChapter 4. Overview of measurement systemsChapter 5 Acceleration, Shock and VibrationChapter 6 FlowChapter 7 TemperatureChapter 8 PressureChapter 9. PositionChapter 10 Strain gauges, loadcells and weighingChapter 11 LightChapter 12 Signal Processing and ConditioningChapter 13 Interfacing and Data CommunicationsChapter 14 Data acquisition softwareChapter 15. Scaling and calibrationChapter 16. Synthetic instrumentsChapter 17 Real-world measurement applicationsChapter 18. Testing methodsChapter 19 Boundary Scan TechniquesChapter 20 Inspection TestChapter 21 EMC fundamentalsChapter 22 Measuring RF emissionsChapter 23 Test methodsChapter 24 Test planningCHAPTER 25 Accelerated testing fundamentalsChapter 26 HALT and FMVTAppendix A: Standard Interfaces

「Nielsen BookData」 より

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