Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China

Author(s)

• International Conference on Optical Instruments and Technology
• Ye, Shenghua
• Zhang, Guangjun
• Ni, Jun
• China Instrument and Control Society
• Society of Photo-optical Instrumentation Engineers
• 中华人民共和国科学技术协会 チュウカ ジンミン キョウワコク カガク ギジュツ キョウカイ zhong hua ren min gong he guo ke xue ji shu xie hui

Bibliographic Information

Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China

Shenghua Ye, Guangjun Zhang, Jun Ni, editors ; sponsored by CIS--China Instrument and Control Society [and] SPIE ; cooperating organizations, Optoelectronic-Mechanic Technology and System Integration Chapter, CIS (China) ... [et al.] ; supporting organizations, China Association for Science and Technology ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 7160）

SPIE, c2009

Other Title

2008 International Conference on Optical Instruments and Technology

Note

Includes bibliographical references and author index

Details

• NCID: BC15338530
• ISBN:
  • 9780819474049
• LCCN: 2010455625
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: 1 v. (various pagings)
• Size: 28 cm
• Classification:
  • LCC : QC367
  • DC22 : 681/.25
• Subject Headings:
  • LCSH : Optical measurements -- Industrial applications -- Congresses
  • LCSH : Optoelectronic devices -- Congresses
  • LCSH : Optical instruments -- Congresses
• Parent Bibliography ID:
  • BA0022700X