Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China
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書誌事項
Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 7160)
SPIE, c2009
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2008 International Conference on Optical Instruments and Technology
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注記
Includes bibliographical references and author index