Polarization : measurement, analysis, and remote sensing VIII : 18-19 March 2008, Orlando, Florida, USA
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Bibliographic Information
Polarization : measurement, analysis, and remote sensing VIII : 18-19 March 2008, Orlando, Florida, USA
（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6972）
SPIE, c2008
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Measurement, analysis, and remote sensing 8
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Includes bibliographical references and index
Description and Table of Contents
Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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