Design, manufacturing, and testing of micro- and nano-optical devices and systems : 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 8-12 July 2007, Chengdu, China

著者

• International Symposium on Advanced Optical Manufacturing and Testing Technologies
• Han, Sen
• Chinese Optical Society
• Chinese Academy of Sciences. Institute of Optics and Electronics
• Society of Photo-optical Instrumentation Engineers
• State Key Laboratory of Optical Technology for Microfabrication (China)
• Sichuan Optical Society
• Chinese Optical Society. Committee of Optical Manufacturing Technology
• 中华人民共和国科学技术部 チュウカ ジンミン キョウワコク カガク ギジュツブ zhong hua ren min gong he guo ke xue ji shu bu
• 中国科学院 チュウゴク カガクイン zhong guo ke xue yuan
• National Natural Science Foundation of China

書誌事項

Design, manufacturing, and testing of micro- and nano-optical devices and systems : 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 8-12 July 2007, Chengdu, China

Sen Han ... [et al.], editors ; sponsored by COS--the Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China) [and] SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 6724）

SPIE, c2007

タイトル別名

3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies

Design, manufacturing, and testing of micro optical and nano optical devices and systems

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

「Nielsen BookData」 より

• NII書誌ID(NCID): BC16169803
• ISBN:
  • 9780819468819
• LCCN: 2010287795
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: 1 v. (various pagings)
• 大きさ: 28 cm
• 分類:
  • LCC : TS510
  • DC22 : 681/.4
• 件名:
  • LCSH : Optical instruments -- Design and construction -- Congresses
  • LCSH : Optical instruments -- Testing -- Congresses
  • LCSH : Optoelectronic devices -- Design and construction -- Congresses
  • LCSH : Optoelectronic devices -- Testing -- Congresses
• 親書誌ID:
  • BA0022700X