Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA

著者

• Postek, Michael T.
• Allgair, John A. (John Alexander)
• Society of Photo-optical Instrumentation Engineers
• United States. National Institute of Standards and Technology

書誌事項

Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA

Michael T. Postek, John A. Allgair, editors ; sponsored and published by SPIE ; cosponsored by NIST--National Institute of Standards and Technology (United States)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 7042）

SPIE, c2008

タイトル別名

Instrumentation, metrology, and standards for nanomanufacturing 2

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BC16169847
• ISBN:
  • 9780819472625
• LCCN: 2010455186
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: 1 v. (various pagings)
• 大きさ: 28 cm
• 分類:
  • LCC : TA418.9.N35
  • DC22 : 620/.5
• 件名:
  • LCSH : Nanostructured materials -- Congresses
  • LCSH : Microfabrication -- Congresses
  • LCSH : Nanomanufacturing -- Congresses
• 親書誌ID:
  • BA0022700X