Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA

著者

• Meyendorf, Norbert
• Baaklini, George Y.
• Michel, Bernd
• United States. National Institute of Standards and Technology
• Institute of Acoustic Microscopy (U.S.)
• Society of Photo-optical Instrumentation Engineers

書誌事項

Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA

Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5045）

SPIE, c2003

タイトル別名

Testing, reliability, and application of micromaterial and nanomaterial systems

注記

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BC1616995X
• ISBN:
  • 0819448508
• LCCN: 2004296961
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: ix, 276 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1750
  • DC22 : 621.36
• 件名:
  • LCSH : Electrooptical devices -- Materials -- Testing -- Congresses
  • LCSH : Photonics -- Materials -- Testing -- Congresses
  • LCSH : Nanostructured materials -- Testing -- Congresses
  • LCSH : Microelectromechanical systems -- Testing -- Congresses
• 親書誌ID:
  • BA0022700X
• リンク:
  • www.loc.gov/catdir/toc/fy054/2004296961.html