MIPPR 2007 : medical imaging, parallel processing of images, and optimization techniques : 15-17 November 2007, Wuhan, China
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International Symposium on Multispectral Image Processing and Pattern Recognition (MIPPR)
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State Key Laboratory for Multi-spectral Information Processing Technologies
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Chinese Education Ministry Key Laboratory for Image Processing and Intelligence Control
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Chinese Academy of Sciences. Institute of Automation
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Author(s)
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International Symposium on Multispectral Image Processing and Pattern Recognition (MIPPR)
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State Key Laboratory for Multi-spectral Information Processing Technologies
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Chinese Education Ministry Key Laboratory for Image Processing and Intelligence Control
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Chinese Academy of Sciences. Institute of Automation
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Bibliographic Information
MIPPR 2007 : medical imaging, parallel processing of images, and optimization techniques : 15-17 November 2007, Wuhan, China
Jianguo Liu ... [et al.], editors ; sponsored by State Key Laboratory for Multi-spectral Information Processing Technologies (China), Chinese Education Ministry Key Laboratory for Image Processing and Intelligence Control (China), Huazhong University of Science and Technology (China) ; technical sponsor, SPIE ; cooperating organizations, Institute of Automation, Chinese Academy of Sciences (China) [and] Wuhan University (China) ; supported by National Natural Science Foundation of China (China) [and] Education Ministry of China (China)
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 6789)(Progress in biomedical optics and imaging, v. 8, no. 48)
SPIE, c2007
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Medical imaging, parallel processing of images, and optimization techniques
Available at / 1 libraries
Note
Includes bibliographical references and author index
Description and Table of Contents
Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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