Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA

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Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA

Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; technical cosponsor, IEICE Communications Society (Japan) ; in cooperation with IEICE Electronics Society (Japan)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5606）

SPIE, c2004

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Two and three dimensional vision systems for inspection, control, and metrology 2

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Includes bibliographical references and author index

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    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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