Quantitative atomic-resolution electron microscopy

Author(s)

• De Backer, Annick
• Fatermans, Jarmo
• den Dekker, Arnold J.
• Van Aert, Sandra
• Hÿtch, Martin
• Hawkes, Peter W.

Bibliographic Information

Quantitative atomic-resolution electron microscopy

Annick De Backer ... [et al.] ; edited by Martin Hÿtch and Peter W. Hawkes

（Advances in imaging and electron physics, v. 217）

Academic Press, c2021

Note

Includes bibliographical references (p. 255-278) and index

Details

• NCID: BC17448052
• ISBN:
  • 9780128246078
• Country Code: uk
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: London
• Pages/Volumes: xi, 282 p.
• Size: 24 cm
• Classification:
  • DC23 : 502.825
• Subject Headings:
  • LCSH : Electron microscopy
  • LCSH : Stereology
• Parent Bibliography ID:
  • BC03122013