Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects
著者
書誌事項
Large-angle convergent-beam electron diffraction (LACBED) : applications to crystal defects
（Monograph of the French Society of Microscopies）
Société Française des Microscopies, c2002
- : pbk
- タイトル別名
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LACBED
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注記
Includes bibliographical references (p. 401-425) and index
内容説明・目次
内容説明
A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
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