An optimal sequential accelerated life test with exponential dependence on stress

Author(s)

• Schwarz, Gideon

Bibliographic Information

An optimal sequential accelerated life test with exponential dependence on stress

by Gideon Schwarz

（Technical report / Stanford University, no. 67）

Applied Mathematics and Statistics Laboratories, Stanford University, 1960

Note

"Prepared under contract nonr-225(52), (NR-342-022), Office of Naval Research"--T.p

Details

• NCID: BC18806511
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Stanford, Calif.
• Pages/Volumes: 10 leaves
• Size: 28 cm
• Parent Bibliography ID:
  • BA60601079