An optimal sequential accelerated life test with exponential dependence on stress
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An optimal sequential accelerated life test with exponential dependence on stress
(Technical report / Stanford University, no. 67)
Applied Mathematics and Statistics Laboratories, Stanford University, 1960
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Library, Research Institute for Mathematical Sciences, Kyoto University数研
L/N||SCH||31||1200043631952
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"Prepared under contract nonr-225(52), (NR-342-022), Office of Naval Research"--T.p