Statistical methods for materials science : the data science of microstructure characterization
Author(s)
Bibliographic Information
Statistical methods for materials science : the data science of microstructure characterization
CRC Press, c2019
- : hardback
Available at 2 libraries
  Aomori
  Iwate
  Miyagi
  Akita
  Yamagata
  Fukushima
  Ibaraki
  Tochigi
  Gunma
  Saitama
  Chiba
  Tokyo
  Kanagawa
  Niigata
  Toyama
  Ishikawa
  Fukui
  Yamanashi
  Nagano
  Gifu
  Shizuoka
  Aichi
  Mie
  Shiga
  Kyoto
  Osaka
  Hyogo
  Nara
  Wakayama
  Tottori
  Shimane
  Okayama
  Hiroshima
  Yamaguchi
  Tokushima
  Kagawa
  Ehime
  Kochi
  Fukuoka
  Saga
  Nagasaki
  Kumamoto
  Oita
  Miyazaki
  Kagoshima
  Okinawa
  Korea
  China
  Thailand
  United Kingdom
  Germany
  Switzerland
  France
  Belgium
  Netherlands
  Sweden
  Norway
  United States of America
Note
Includes bibliographical references (p. 445-500) and index
Description and Table of Contents
Description
Data analytics has become an integral part of materials science. This book provides the practical tools and fundamentals needed for researchers in materials science to understand how to analyze large datasets using statistical methods, especially inverse methods applied to microstructure characterization. It contains valuable guidance on essential topics such as denoising and data modeling. Additionally, the analysis and applications section addresses compressed sensing methods, stochastic models, extreme estimation, and approaches to pattern detection.
Table of Contents
1 Materials Science vs. Data Science 2 Emerging Digital Data Capabilities 3 Cultural Differences 4 Forward Modeling 5 Inverse Problems and Sensing 6 Model-Based Iterative Reconstruction for Electron Tomography 7 Statistical reconstruction and heterogeneity characterization in 3-D biological macromolecular complexes 8 Object Tracking through Image Sequences 9 Grain Boundary Characteristics 10 Interface Science and the Formation of Structure 11 Hierarchical Assembled Structures from Nanoparticles 12 Estimating Orientation Statistics 13 Representation of Stochastic Microstructures 14 Computer Vision for Microstructure Representation 15 Topological Analysis of Local Structure 16 Markov Random Fields for Microstructure Simulation 17 Distance Measures for Microstructures 18 Industrial Applications 19 Anomaly Testing 20 Anomalies in Microstructures 21 Denoising Methods with Applications to Microscopy 22 Compressed Sensing for Imaging Applications 23 Dictionary Methods for Compressed Sensing 24 Sparse Sampling in Microscopy
by "Nielsen BookData"