Advances in imaging and electron physics
著者
書誌事項
Advances in imaging and electron physics
Academic Press, c2023
- v. 225
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
目次
Preface
1. Novel theory of the structure of elementary particles
H. Rose
2. Electron diffractive optics based on the magnetic Aharonov-Bohm effect
Roman Castaneda, Pablo Bedoya-Rios and Giorgio Matteucci
3. Electronic image recording in conventional electron microscopy
K.-H. Herrmann and D. Krahl
4. The phase problem in electron microscopy
D. L. Misell
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