Coherent electron microscopy : designing faster and brighter electron sources

著者

    • Houdellier, Florent
    • Hÿtch, Martin
    • Hawkes, Peter W.

書誌事項

Coherent electron microscopy : designing faster and brighter electron sources

Florent Houdellier ; edited by Martin Hÿtch, Peter W. Hawkes

(Advances in imaging and electron physics, v. 227)

Academic Press, c2023

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注記

Includes bibliographical references (p. 217-227) and index

内容説明・目次

内容説明

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

目次

1. Characterization of nanomaterials properties using FE-TEM Florent Houdellier 2. Cold field emission electron source: From higher brightness to ultrafast beam Florent Houdellier 3. Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources Florent Houdellier

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詳細情報

  • NII書誌ID(NCID)
    BD0472259X
  • ISBN
    • 9780443193248
  • 出版国コード
    ne
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Amsterdam
  • ページ数/冊数
    xv, 234 p.
  • 大きさ
    24 cm
  • 分類
  • 件名
  • 親書誌ID
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