{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BD04981237.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BD04981237#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BD04981237.json"},"dc:title":[{"@value":"XAFS for everyone"}],"dc:creator":"Scott Calvin","dc:publisher":[{"@value":"CRC Press"}],"dcterms:extent":"xxiv, 416 pages","cinii:size":"29 cm","dc:language":"eng","dc:date":"2025","cinii:ncid":"BD04981237","prism:edition":"2nd edition","cinii:ownerCount":"1","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Calvin, Scott"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA022084","@type":"foaf:Organization","foaf:name":"九州大学 筑紫図書館","rdfs:seeAlso":{"@id":"https://catalog.lib.kyushu-u.ac.jp/opac_openurl/?ncid=BD04981237"}}],"bibo:lccn":["2023051990"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/2023051990"}],"prism:publicationDate":["2025"],"cinii:note":["Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)","Includes bibliographical references and index","Summary:\"XAFS for Everyone provides a practical, thorough guide to x-ray absorption fine-structure (XAFS) spectroscopy for both novices and seasoned practitioners from a range of disciplines. It's enhanced with more than 200 figures as well as cartoon characters who offer informative commentary on the different approaches used in XAFS spectroscopy. This second edition now includes chapters on spatial and temporal resolution, alternative measurement modes including resonant inelastic x-ray scattering (RIXS) and high-energy resolution fluorescence detection (HERFD), and an expanded chapter on experimental design. In addition, this edition adds new sections on wavelet transforms, blind source separation, free electron lasers, and theoretical XANES standards, as well as three new case studies. XAFS for Everyone covers sample preparation, data reduction, tips and tricks for data collection, fingerprinting, linear combination analysis, principal component analysis, and modeling using theoretical standards. It descr"],"dc:subject":["LCC:QC482.S6","DC23:543/.62","DC23:543.62"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Extended+X-ray+absorption+fine+structure","dc:title":"Extended X-ray absorption fine structure"}],"dcterms:hasPart":[{"@id":"urn:isbn:9781032745480","dc:title":": hbk"}]}]}