Atomic force microscopy

Author(s)

• Voigtländer, Bert

Bibliographic Information

Atomic force microscopy

Bert Voigtländer

（Nanoscience and technology）

Springer, c2019

2nd ed

• : hbk

Note

"The first edition (2015, ISBN 978-3-662-45240-0) was published under the title, "Scanning Probe Microscopy"."--T.p. verso

Includes bibliographical references and index

Details

• NCID: BD05107663
• ISBN:
  • 9783030136536
• Country Code: sz
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Cham
• Pages/Volumes: xiv, 331 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BA33734375