ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California

著者

• International Symposium for Testing and Failure Analysis
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2001 : proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California

sponsored by EDFAS, ISTFA/2001

ASM International, c2001

タイトル別名

ISTFA 2001, 11-15, November, conference proceedings from the 27th International Symposium for Testing and Failure Analysis

ISTFA 2001

Proceedings of the twenty-seventh International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California

注記

EDFAS : Electronic Device Failure Analysis Society

詳細情報

• NII書誌ID(NCID): BD0941313X
• ISBN:
  • 0871707462
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xix, 485 pages
• 大きさ: 28 cm
• 付属資料: CD-ROM