ISTFA/2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California

著者

• International Symposium for Testing and Failure Analysis
• Electronic Device Failure Analysis Society
• ASM International

書誌事項

ISTFA/2003 : proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California

sponsored by EDFAS

ASM International, c2003

タイトル別名

ISTFA 2003, 2-6 November 2003, conference proceedings from the 29th International Symposium for Testing and Failure Analysis

ISTFA 2003

Proceedings of the twenty-ninth International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara, California

詳細情報

• NII書誌ID(NCID): BD09413242
• ISBN:
  • 0871707888
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xviii, 518 pages
• 大きさ: 28 cm
• 付属資料: CD-ROM