{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BD09972743.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BD09972743#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BD09972743.json"},"dc:title":[{"@value":"Semiconductor metasurfaces"}],"dc:creator":"edited by Martin Hafermann, Sarah Walden","dc:publisher":[{"@value":"Academic Press, an imprint of Elsevier"}],"dcterms:extent":"vii, 98 pages","cinii:size":"24 cm","dc:language":"eng","dc:date":"2024","cinii:ncid":"BD09972743","cinii:ownerCount":"8","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Hafermann, Martin"}]},{"@id":"https://ci.nii.ac.jp/author/DA12714150#entity","@type":"foaf:Person","foaf:name":[{"@value":"Walden, Sarah"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA014508","@type":"foaf:Organization","foaf:name":"広島大学 図書館 西図書館","rdfs:seeAlso":{"@id":"https://opac.lib.hiroshima-u.ac.jp/iwjs0027opc/cattab.do?sp_srh_flg=true&tab_num=0&ncid=BD09972743"}},{"@id":"https://ci.nii.ac.jp/library/FA005278","@type":"foaf:Organization","foaf:name":"国士舘大学 図書館・情報メディアセンター","rdfs:seeAlso":{"@id":"https://opac.kokushikan.ac.jp/opac/search?target=local&searchmode=complex&autoDetail=true&s_ncid=BD09972743"}},{"@id":"https://ci.nii.ac.jp/library/FA006066","@type":"foaf:Organization","foaf:name":"東京電機大学 総合メディアセンター 千住センター"},{"@id":"https://ci.nii.ac.jp/library/FA006576","@type":"foaf:Organization","foaf:name":"法政大学 小金井図書館","rdfs:seeAlso":{"@id":"https://opac.lib.hosei.ac.jp/opac/opac_openurl?ncid=BD09972743"}},{"@id":"https://ci.nii.ac.jp/library/FA006973","@type":"foaf:Organization","foaf:name":"東京工芸大学 図書館"},{"@id":"https://ci.nii.ac.jp/library/FA007069","@type":"foaf:Organization","foaf:name":"福井工業大学 図書館"},{"@id":"https://ci.nii.ac.jp/library/FA007364","@type":"foaf:Organization","foaf:name":"豊田工業大学 総合情報センター"},{"@id":"https://ci.nii.ac.jp/library/FA007965","@type":"foaf:Organization","foaf:name":"関西大学 図書館","rdfs:seeAlso":{"@id":"https://www.lib.kansai-u.ac.jp/webopac/ufirdi.do?ufi_target=ctlsrh&ncid=BD09972743"}}],"prism:publicationDate":["2024"],"cinii:note":["Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)","Includes bibliographical references and index"],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BC06178455#entity","dc:title":"Semiconductors and semimetals, volume 117","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:9780443314643","dc:title":"Part 2"}]}]}