Electron nano-imaging : basics of imaging and diffraction for TEM and STEM

Author(s)

• 田中, 信夫 タナカ, ノブオ

Bibliographic Information

Electron nano-imaging : basics of imaging and diffraction for TEM and STEM

Nobuo Tanaka

Springer, [2024] , , c2024

2nd edition

Note

Content Type: text (ncrcontent), Media Type: unmediated (ncrmedia), Carrier Type: volume (ncrcarrier)

"1st edition: c Springer Japan KK 2017"--Title page verso

Includes bibliographical references and indexes

Details

• NCID: BD10828755
• ISBN:
  • 9784431569398
• Country Code: ja
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Tokyo
• Pages/Volumes: xxx, 384 pages
• Size: 25 cm
• Classification:
  • DC23 : 502.825
• Subject Headings:
  • LCSH : Transmission electron microscopy
  • LCSH : Scanning transmission electron microscopy